About author:SHI Yi-min（1952－）,male ,native of Xi ’an ,Shaanxi ,a professor of Northwestern Polytechnical University , M．S．D．,engages in applied probability statistics ,reliability theory ,Bayes statistics and inference .
SHI Yi-min , SHI Xiao-lin , LI Ke-xue . Convergence Rate of Empirical Bayes Test for the Parameter of the Truncated-type Distribution Families [J]. Chinese Quarterly Journal of Mathematics, 2003, 18(3): 276-282.
