Chinese Quarterly Journal of Mathematics ›› 1994, Vol. 9 ›› Issue (1): 78-89.
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Abstract: Recently the problem of determining the minimum number of parity tests for finding two defectives remains open.This is a surprisingly difficult combinatorial problem.In this paper,we give three procedures(H-P,A-H-P and U-P)ard solve this problem perfectly.
Key words: model P, test-set, optimal scheme, information-theoretic bound
CLC Number:
O221
Liu Wenan, Ding Chengjie. The Optimal Scheme of Defective Coin Problem for Model P[J]. Chinese Quarterly Journal of Mathematics, 1994, 9(1): 78-89.
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https://sxjk.magtechjournal.com/EN/Y1994/V9/I1/78